Sub-Grain Scale Digital Image Correlation by Electron Microscopy for Polycrystalline Materials during Elastic and Plastic Deformation

Title
Sub-Grain Scale Digital Image Correlation by Electron Microscopy for Polycrystalline Materials during Elastic and Plastic Deformation
Authors
Keywords
High resolution digital image correlation, DIC, Scanning electron microscopy, SEM, Slip bands, Polycrystalline materials, René 88DT, Strain localization
Journal
EXPERIMENTAL MECHANICS
Volume 56, Issue 2, Pages 197-216
Publisher
Springer Nature
Online
2015-09-12
DOI
10.1007/s11340-015-0083-4

Ask authors/readers for more resources

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now