Digital Image Correlation under Scanning Electron Microscopy: Methodology and Validation

Published 2013 View Full Article

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Title
Digital Image Correlation under Scanning Electron Microscopy: Methodology and Validation
Authors
Keywords
Digital Image Correction, DIC, Scanning Electron Microscopy, SEM, Image Distortion, Deformation Mapping, Image Noise, Strain Localization
Journal
EXPERIMENTAL MECHANICS
Volume 53, Issue 9, Pages 1743-1761
Publisher
Springer Nature
Online
2013-07-11
DOI
10.1007/s11340-013-9782-x
References
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