Argon Cluster Sputtering Source for ToF-SIMS Depth Profiling of Insulating Materials: High Sputter Rate and Accurate Interfacial Information

Study on the molecular distribution of organic composite films by combining photoemission spectroscopy with argon gas cluster ion beam sputtering

(2015) Dong-Jin Yun et al.   Journal of Materials Chemistry C

Effects of the temperature and beam parameters on depth profiles in X-ray photoelectron spectrometry and secondary ion mass spectrometry under C60+–Ar+ cosputtering

(2014) Hua-Yang Liao et al.   ANALYTICA CHIMICA ACTA

Low-temperature lithium diffusion in simulated high-level boroaluminosilicate nuclear waste glasses

(2014) James J. Neeway et al.   JOURNAL OF NON-CRYSTALLINE SOLIDS

ToF-SIMS depth profiling of insulating samples, interlaced mode or non-interlaced mode?

(2014) Zhaoying Wang et al.   SURFACE AND INTERFACE ANALYSIS

Reversible nano-structuring of SrCrO3-δ through oxidation and reduction at low temperature

(2014) K. H. L. Zhang et al.   Nature Communications

Argon Cluster Ion Source Evaluation on Lipid Standards and Rat Brain Tissue Samples

(2013) Claudia Bich et al.   ANALYTICAL CHEMISTRY

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

(2012) Alexander G. Shard et al.   ANALYTICAL CHEMISTRY

Secondary Ion Mass Spectrometry: Characterizing Complex Samples in Two and Three Dimensions

(2012) John S. Fletcher et al.   ANALYTICAL CHEMISTRY

Coupled alkali feldspar dissolution and secondary mineral precipitation in batch systems – 2: New experiments with supercritical CO2 and implications for carbon sequestration

(2012) Peng Lu et al.   APPLIED GEOCHEMISTRY

Observations on X-ray enhanced sputter rates in argon cluster ion sputter depth profiling of polymers

(2012) Peter J. Cumpson et al.   SURFACE AND INTERFACE ANALYSIS

TOF-SIMS with Argon Gas Cluster Ion Beams: A Comparison with C60+

(2011) Sadia Rabbani et al.   ANALYTICAL CHEMISTRY

Dissolution mechanism of the SON68 reference nuclear waste glass: New data in dynamic system in silica saturation conditions

(2011) J. Neeway et al.   JOURNAL OF NUCLEAR MATERIALS

Elemental and isotopic (29Si and 18O) tracing of glass alteration mechanisms

(2010) Nathalie Valle et al.   GEOCHIMICA ET COSMOCHIMICA ACTA

Using C60+ sputtering to improve detection limit of nitrogen in zinc oxide

(2010) Zihua Zhu et al.   SURFACE AND INTERFACE ANALYSIS

Removal of Ar+ beam-induced damaged layers from polyimide surfaces with argon gas cluster ion beams

(2010) Takuya Miyayama et al.   SURFACE AND INTERFACE ANALYSIS

Instability, intermixing and electronic structure at the epitaxial LaAlO3/SrTiO3(001) heterojunction

(2010) S.A. Chambers et al.   SURFACE SCIENCE REPORTS

Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions

(2009) J. L. S. Lee et al.   ANALYTICAL CHEMISTRY

Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams

(2009) Satoshi Ninomiya et al.   RAPID COMMUNICATIONS IN MASS SPECTROMETRY

Investigation of gel porosity clogging during glass leaching

(2008) Patrick Jollivet et al.   JOURNAL OF NON-CRYSTALLINE SOLIDS

A Thin Film Approach to Engineering Functionality into Oxides

(2008) Darrell G. Schlom et al.   JOURNAL OF THE AMERICAN CERAMIC SOCIETY

Insight into silicate-glass corrosion mechanisms

(2008) Céline Cailleteau et al.   NATURE MATERIALS