Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions

Published 2009 View Full Article

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Title
Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions
Authors
Keywords
-
Journal
ANALYTICAL CHEMISTRY
Volume 82, Issue 1, Pages 98-105
Publisher
American Chemical Society (ACS)
Online
2009-12-04
DOI
10.1021/ac901045q

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