Thickness-dependent phase evolution and dielectric property of Hf0.5Zr0.5O2 thin films prepared with aqueous precursor

Title
Thickness-dependent phase evolution and dielectric property of Hf0.5Zr0.5O2 thin films prepared with aqueous precursor
Authors
Keywords
Hf<sub>0.5</sub>Zr<sub>0.5</sub>O<sub>2</sub> thin films, Aqueous precursor, Phase transition, Thickness dependence, Dielectric property
Journal
JOURNAL OF SOL-GEL SCIENCE AND TECHNOLOGY
Volume 77, Issue 2, Pages 430-436
Publisher
Springer Nature
Online
2015-10-01
DOI
10.1007/s10971-015-3871-5

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