Effect of Charge Trapping∕Detrapping on Threshold Voltage Shift of IGZO TFTs under AC Bias Stress

Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress

(2010) Yu-Chun Chen et al.   APPLIED PHYSICS LETTERS

Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress

(2010) Te-Chih Chen et al.   APPLIED PHYSICS LETTERS

Effect of Surface Treatment of Gate-Insulator on Uniformity of Bottom-Gate ZnO Thin Film Transistors

(2010) Mamoru Furuta et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Electrical stress-induced instability of amorphous indium-gallium-zinc oxide thin-film transistors under bipolar ac stress

(2009) Sangwon Lee et al.   APPLIED PHYSICS LETTERS

The influence of the gate dielectrics on threshold voltage instability in amorphous indium-gallium-zinc oxide thin film transistors

(2009) Jaeseob Lee et al.   APPLIED PHYSICS LETTERS

Local structure and conduction mechanism in amorphous In–Ga–Zn–O films

(2009) Deok-Yong Cho et al.   APPLIED PHYSICS LETTERS

Comparative study of electrical instabilities in top-gate InGaZnO thin film transistors with Al2O3 and Al2O3/SiNx gate dielectrics

(2009) Jeong-Min Lee et al.   APPLIED PHYSICS LETTERS

Comprehensive studies on the stabilities of a-In-Ga-Zn-O based thin film transistor by constant current stress

(2009) Kenji Nomura et al.   THIN SOLID FILMS

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors

(2008) A. Suresh et al.   APPLIED PHYSICS LETTERS

Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

(2008) Jeong-Min Lee et al.   APPLIED PHYSICS LETTERS

Bulk-Limited Current Conduction in Amorphous InGaZnO Thin Films

(2008) Hyun-Joong Chung et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Charge trapping and detrapping characteristics in amorphous InGaZnO TFTs under static and dynamic stresses

(2008) In-Tak Cho et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY