Charge trapping and detrapping characteristics in amorphous InGaZnO TFTs under static and dynamic stresses

Title
Charge trapping and detrapping characteristics in amorphous InGaZnO TFTs under static and dynamic stresses
Authors
Keywords
-
Journal
SEMICONDUCTOR SCIENCE AND TECHNOLOGY
Volume 24, Issue 1, Pages 015013
Publisher
IOP Publishing
Online
2008-12-13
DOI
10.1088/0268-1242/24/1/015013

Ask authors/readers for more resources

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now