In situ infrared spectroscopy study of the interface self-cleaning during the atomic layer deposition of HfO2 on GaAs(100) surfaces
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Title
In situ infrared spectroscopy study of the interface self-cleaning during the atomic layer deposition of HfO2 on GaAs(100) surfaces
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 105, Issue 12, Pages 121604
Publisher
AIP Publishing
Online
2014-09-24
DOI
10.1063/1.4896501
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