Spatially-resolved spectroscopic measurements of Ec − 0.57 eV traps in AlGaN/GaN high electron mobility transistors

Published 2013 View Full Article

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Title
Spatially-resolved spectroscopic measurements of Ec − 0.57 eV traps in AlGaN/GaN high electron mobility transistors
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 102, Issue 19, Pages 193509
Publisher
AIP Publishing
Online
2013-05-17
DOI
10.1063/1.4806980
References
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