Reliability of GaN High-Electron-Mobility Transistors: State of the Art and Perspectives

Published 2008 View Full Article

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Title
Reliability of GaN High-Electron-Mobility Transistors: State of the Art and Perspectives
Authors
Keywords
-
Journal
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Volume 8, Issue 2, Pages 332-343
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2008-06-11
DOI
10.1109/tdmr.2008.923743
References
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