Effect of tip polarity on Kelvin probe force microscopy images of thin insulator CaF2 films on Si(111)

标题
Effect of tip polarity on Kelvin probe force microscopy images of thin insulator CaF2 films on Si(111)
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 101, Issue 8, Pages 083119
出版商
AIP Publishing
发表日期
2012-08-25
DOI
10.1063/1.4748291

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