Lateral resolution and potential sensitivity in Kelvin probe force microscopy: Towards understanding of the sub-nanometer resolution

Published 2008 View Full Article

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Title
Lateral resolution and potential sensitivity in Kelvin probe force microscopy: Towards understanding of the sub-nanometer resolution
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 77, Issue 23, Pages -
Publisher
American Physical Society (APS)
Online
2008-06-19
DOI
10.1103/physrevb.77.235427

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