The impact of SiNx gate insulators on amorphous indium-gallium-zinc oxide thin film transistors under bias-temperature-illumination stress

The influence of the gate dielectrics on threshold voltage instability in amorphous indium-gallium-zinc oxide thin film transistors

(2009) Jaeseob Lee et al.   APPLIED PHYSICS LETTERS

The effect of moisture on the photon-enhanced negative bias thermal instability in Ga–In–Zn–O thin film transistors

(2009) Kwang-Hee Lee et al.   APPLIED PHYSICS LETTERS

High performance thin film transistor with cosputtered amorphous Zn–In–Sn–O channel: Combinatorial approach

(2009) Min Ki Ryu et al.   APPLIED PHYSICS LETTERS

Amorphous hafnium-indium-zinc oxide semiconductor thin film transistors

(2009) Chang-Jung Kim et al.   APPLIED PHYSICS LETTERS

High Reliable and Manufacturable Gallium Indium Zinc Oxide Thin-Film Transistors Using the Double Layers as an Active Layer

(2009) Sun IL Kim et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Novel ZrInZnO Thin-film Transistor with Excellent Stability

(2008) Jin-Seong Park et al.   ADVANCED MATERIALS

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

Stable ZnO thin film transistors by fast open air atomic layer deposition

(2008) David H. Levy et al.   APPLIED PHYSICS LETTERS

Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors

(2008) A. Suresh et al.   APPLIED PHYSICS LETTERS

Bottom-Gate Gallium Indium Zinc Oxide Thin-Film Transistor Array for High-Resolution AMOLED Display

(2008) Jang Yeon Kwon et al.   IEEE ELECTRON DEVICE LETTERS

Methods of producing plasma enhanced chemical vapor deposition silicon nitride thin films with high compressive and tensile stress

(2008) M. Belyansky et al.   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A