Nanoscale elastic strain mapping of polycrystalline materials

Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping

(2017) Thomas C. Pekin et al.   ULTRAMICROSCOPY

Microstructural Characterization of a Commercial Hot-Pressed Boron Carbide Armor Plate

(2016) Kelvin Y. Xie et al.   JOURNAL OF THE AMERICAN CERAMIC SOCIETY

Strain mapping of semiconductor specimens with nm-scale resolution in a transmission electron microscope

(2016) David Cooper et al.   MICRON

Breaking the icosahedra in boron carbide

(2016) Kelvin Y. Xie et al.   PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA

Cross-sectional stress distribution in Al x Ga 1-x N heterostructure on Si(111) substrate characterized by ion beam layer removal method and precession electron diffraction

(2016) M. Reisinger et al.   MATERIALS & DESIGN

Strain mapping at nanometer resolution using advanced nano-beam electron diffraction

(2015) V. B. Ozdol et al.   APPLIED PHYSICS LETTERS

Theoretical study of precision and accuracy of strain analysis by nano-beam electron diffraction

(2015) Christoph Mahr et al.   ULTRAMICROSCOPY

Strain mapping at the nanoscale using precession electron diffraction in transmission electron microscope with off axis camera

(2014) M. P. Vigouroux et al.   APPLIED PHYSICS LETTERS

Automated crystal orientation and phase mapping in TEM

(2014) E.F. Rauch et al.   MATERIALS CHARACTERIZATION

Applications of Automated High Resolution Strain Mapping in TEM on the Study of Strain Distribution in MOSFETs

(2014) A. D. Darbal et al.   MICROSCOPY AND MICROANALYSIS

Improved strain precision with high spatial resolution using nanobeam precession electron diffraction

(2013) Jean-Luc Rouviere et al.   APPLIED PHYSICS LETTERS

Orientation and phase mapping in the transmission electron microscope using precession-assisted diffraction spot recognition: state-of-the-art results

(2013) D. VILADOT et al.   JOURNAL OF MICROSCOPY

Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography

(2013) A. Béché et al.   ULTRAMICROSCOPY

Thermal expansion of nanocrystalline boron carbide

(2012) Trinadha Raja Pilladi et al.   CERAMICS INTERNATIONAL

Plastic Strain Mapping with Sub-micron Resolution Using Digital Image Correlation

(2012) F. Di Gioacchino et al.   EXPERIMENTAL MECHANICS

Strain Measurement in Semiconductor Heterostructures by Scanning Transmission Electron Microscopy

(2012) Knut Müller et al.   MICROSCOPY AND MICROANALYSIS

Phase, grain structure, stress, and resistivity of sputter-deposited tungsten films

(2011) Dooho Choi et al.   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A

Evaluation of two-dimensional strain distribution by STEM/NBD

(2011) Fumihiko Uesugi et al.   ULTRAMICROSCOPY

An efficient, simple, and precise way to map strain with nanometer resolution in semiconductor devices

(2010) Christoph T. Koch et al.   APPLIED PHYSICS LETTERS

Improved precision in strain measurement using nanobeam electron diffraction

(2009) A. Béché et al.   APPLIED PHYSICS LETTERS

Measuring and modeling distributions of stress state in deforming polycrystals

(2008) M.P. Miller et al.   ACTA MATERIALIA