POx/Al2O3 stacks: Highly effective surface passivation of crystalline silicon with a large positive fixed charge

Effective Surface Passivation of InP Nanowires by Atomic-Layer-Deposited Al2O3 with POx Interlayer

(2017) L. E. Black et al.   NANO LETTERS

Tantalum oxide/silicon nitride: A negatively charged surface passivation stack for silicon solar cells

(2015) Yimao Wan et al.   APPLIED PHYSICS LETTERS

Plasma enhanced atomic layer deposition of gallium oxide on crystalline silicon: demonstration of surface passivation and negative interfacial charge

(2015) Thomas G. Allen et al.   Physica Status Solidi-Rapid Research Letters

Excellent c-Si surface passivation by low-temperature atomic layer deposited titanium oxide

(2014) Baochen Liao et al.   APPLIED PHYSICS LETTERS

Study of hydrogenated AlN as an anti-reflective coating and for the effective surface passivation of silicon

(2013) Georg Krugel et al.   Physica Status Solidi-Rapid Research Letters

Characterisation and optimisation of PECVD SiNx as an antireflection coating and passivation layer for silicon solar cells

(2013) Yimao Wan et al.   AIP Advances

Electrical characterization of atomic-layer-deposited hafnium oxide films from hafnium tetrakis(dimethylamide) and water/ozone: Effects of growth temperature, oxygen source, and postdeposition annealing

(2012) Hector García et al.   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A

Physical properties and electrical characteristics of H2O-based and O3-based HfO2 films deposited by ALD

(2012) Jibin Fan et al.   MICROELECTRONICS RELIABILITY

Improved quantitative description of Auger recombination in crystalline silicon

(2012) Armin Richter et al.   PHYSICAL REVIEW B

Influence of the Deposition Temperature on the c-Si Surface Passivation by Al[sub 2]O[sub 3] Films Synthesized by ALD and PECVD

(2010) G. Dingemans et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Influence of the Oxidant on the Chemical and Field-Effect Passivation of Si by ALD Al[sub 2]O[sub 3]

(2010) G. Dingemans et al.   ELECTROCHEMICAL AND SOLID STATE LETTERS

Impurity doping inSiO2: Formation energies and defect levels from first-principles calculations

(2010) Dong Han et al.   PHYSICAL REVIEW B

Structure−Property Relations in Mixed-Network Glasses: Multinuclear Solid State NMR Investigations of the System xAl2O3:(30 − x)P2O5:70SiO2

(2009) Bruce G. Aitken et al.   Journal of Physical Chemistry C

On the c-Si surface passivation mechanism by the negative-charge-dielectric Al2O3

(2008) B. Hoex et al.   JOURNAL OF APPLIED PHYSICS