Physical properties and electrical characteristics of H2O-based and O3-based HfO2 films deposited by ALD

Title
Physical properties and electrical characteristics of H2O-based and O3-based HfO2 films deposited by ALD
Authors
Keywords
-
Journal
MICROELECTRONICS RELIABILITY
Volume 52, Issue 6, Pages 1043-1049
Publisher
Elsevier BV
Online
2012-02-21
DOI
10.1016/j.microrel.2012.01.010

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now