MEMS Device for Quantitative In Situ Mechanical Testing in Electron Microscope
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Title
MEMS Device for Quantitative In Situ Mechanical Testing in Electron Microscope
Authors
Keywords
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Journal
Micromachines
Volume 8, Issue 2, Pages 31
Publisher
MDPI AG
Online
2017-01-24
DOI
10.3390/mi8020031
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