New horizons in sputter depth profiling inorganics with giant gas cluster sources: Niobium oxide thin films

Systematic Temperature Effects in the Argon Cluster Ion Sputter Depth Profiling of Organic Materials Using Secondary Ion Mass Spectrometry

(2016) Martin P. Seah et al.   JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY

Observed damage during Argon gas cluster depth profiles of compound semiconductors

(2014) Anders J. Barlow et al.   JOURNAL OF APPLIED PHYSICS

Electronic structures of SiO2thin films via Ar gas cluster ion beam sputtering

(2014) Yong Koo Kyoung et al.   SURFACE AND INTERFACE ANALYSIS

Ar cluster ion beam sputtering of InSb investigated by ToF-SIMS

(2014) Toyomitsu Miyasaka et al.   SURFACE AND INTERFACE ANALYSIS

Formation–structure–properties of niobium-oxide nanocolumn arrays via self-organized anodization of sputter-deposited aluminum-on-niobium layers

(2014) Alexander Mozalev et al.   Journal of Materials Chemistry C

Accurate argon cluster-ion sputter yields: Measured yields and effect of the sputter threshold in practical depth-profiling by x-ray photoelectron spectroscopy and secondary ion mass spectrometry

(2013) Peter J. Cumpson et al.   JOURNAL OF APPLIED PHYSICS

Universal Equation for Argon Gas Cluster Sputtering Yields

(2013) M. P. Seah   Journal of Physical Chemistry C

Depth Profiling and Melting of Nanoparticles in Secondary Ion Mass Spectrometry (SIMS)

(2013) Li Yang et al.   Journal of Physical Chemistry C

The investigation of NbO2and Nb2O5electronic structure by XPS, UPS and first principles methods

(2013) Zhang Weibin et al.   SURFACE AND INTERFACE ANALYSIS

Dielectric properties and X-ray photoelectron spectroscopic studies of niobium oxide thin films prepared by direct liquid injection chemical vapor deposition method

(2013) Dinesh Chand Bharti et al.   THIN SOLID FILMS

Sputtering Yields for Gold Using Argon Gas Cluster Ion Beams

(2012) Li Yang et al.   Journal of Physical Chemistry C

TOF-SIMS depth profiling of multilayer amino-acid films using large Argon cluster Arn+, C60+and Cs+sputtering ions: A comparative study

(2012) N. Wehbe et al.   SURFACE AND INTERFACE ANALYSIS

Comparison of C60and GCIB primary ion beams for the analysis of cancer cells and tumour sections

(2012) John S. Fletcher et al.   SURFACE AND INTERFACE ANALYSIS

Dual beam depth profiling of polymer materials: comparison of C60and Ar cluster ion beams for sputtering

(2012) D. Rading et al.   SURFACE AND INTERFACE ANALYSIS

Highly sensitive analysis of surface contaminants by Ar gas cluster SIMS

(2012) Kousuke Moritani et al.   SURFACE AND INTERFACE ANALYSIS

Damage profiles of Si (001) surface via Ar cluster beam sputtering

(2012) Yong Koo Kyoung et al.   SURFACE AND INTERFACE ANALYSIS

Surface spectrometry using large argon clusters

(2012) S. Kayser et al.   SURFACE AND INTERFACE ANALYSIS

Sputtered ion emission under size-selected Arn+cluster ion bombardment

(2012) Hubert Gnaser et al.   SURFACE AND INTERFACE ANALYSIS

Ion-induced damage evaluation with Ar cluster ion beams

(2012) Yasuyuki Yamamoto et al.   SURFACE AND INTERFACE ANALYSIS

Organic depth profiling of C60and C60/phthalocyanine layers using argon clusters

(2012) T. Mouhib et al.   SURFACE AND INTERFACE ANALYSIS

TOF-SIMS with Argon Gas Cluster Ion Beams: A Comparison with C60+

(2011) Sadia Rabbani et al.   ANALYTICAL CHEMISTRY

Depth resolution and inhomogeneity of the sputtering dose with sample rotation and ion beam rastering

(2011) A. G. Shard et al.   SURFACE AND INTERFACE ANALYSIS

Analysis of organic semiconductor multilayers with Ar cluster secondary ion mass spectrometry

(2010) Satoshi Ninomiya et al.   SURFACE AND INTERFACE ANALYSIS

Organic Depth Profiling of a Nanostructured Delta Layer Reference Material Using Large Argon Cluster Ions

(2009) J. L. S. Lee et al.   ANALYTICAL CHEMISTRY

Matrix-free detection of intact ions from proteins in argon-cluster secondary ion mass spectrometry

(2009) Kozo Mochiji et al.   RAPID COMMUNICATIONS IN MASS SPECTROMETRY

Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams

(2009) Satoshi Ninomiya et al.   RAPID COMMUNICATIONS IN MASS SPECTROMETRY

A fragment-free ionization technique for organic mass spectrometry with large Ar cluster ions

(2008) Satoshi Ninomiya et al.   APPLIED SURFACE SCIENCE

High sputtering yields of organic compounds by large gas cluster ions

(2008) K. Ichiki et al.   APPLIED SURFACE SCIENCE

Preferential Sputtering of DNA Molecules on a Graphite Surface by Ar Cluster Ion Beam

(2008) Kousuke Moritani et al.   Journal of Physical Chemistry C