The Characteristics of Binary Spike-Time-Dependent Plasticity in HfO2-Based RRAM and Applications for Pattern Recognition

Title
The Characteristics of Binary Spike-Time-Dependent Plasticity in HfO2-Based RRAM and Applications for Pattern Recognition
Authors
Keywords
RRAM, ALD, STDP, Unsupervised online learning, Pattern recognition
Journal
Nanoscale Research Letters
Volume 12, Issue 1, Pages -
Publisher
Springer Nature
Online
2017-04-04
DOI
10.1186/s11671-017-2023-y

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