Chromatic Aberration Correction for Atomic Resolution TEM Imaging from 20 to 80 kV

Resolution enhancement in transmission electron microscopy with 60-kV monochromated electron source

(2016) Shigeyuki Morishita et al.   APPLIED PHYSICS LETTERS

Transmission Electron Microscopy: Isotope Substitution Extends the Lifetime of Organic Molecules in Transmission Electron Microscopy (Small 5/2015)

(2015) Thomas W. Chamberlain et al.   Small

On Proper Phase Contrast Imaging in Aberration Corrected TEM

(2014) Peter Hartel et al.   MICROSCOPY AND MICROANALYSIS

Choice of operating voltage for a transmission electron microscope

(2014) R.F. Egerton   ULTRAMICROSCOPY

Aberration-corrected STEM/TEM imaging at 15 kV

(2014) Takeo Sasaki et al.   ULTRAMICROSCOPY

The pristine atomic structure of MoS2 monolayer protected from electron radiation damage by graphene

(2013) Gerardo Algara-Siller et al.   APPLIED PHYSICS LETTERS

Achromatic Elemental Mapping Beyond the Nanoscale in the Transmission Electron Microscope

(2013) K. W. Urban et al.   PHYSICAL REVIEW LETTERS

Thermal Magnetic Field Noise Limits Resolution in Transmission Electron Microscopy

(2013) Stephan Uhlemann et al.   PHYSICAL REVIEW LETTERS

Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene

(2012) Jannik C. Meyer et al.   PHYSICAL REVIEW LETTERS

Assessment of lower-voltage TEM performance using 3D Fourier transform of through-focus series

(2012) Koji Kimoto et al.   ULTRAMICROSCOPY

Stability of Graphene Edges under Electron Beam: Equilibrium Energetics versus Dynamic Effects

(2011) Jani Kotakoski et al.   ACS Nano

Chemical Distribution and Bonding of Lithium in Intercalated Graphite: Identification with Optimized Electron Energy Loss Spectroscopy

(2011) Feng Wang et al.   ACS Nano

Single atom spectroscopy with reduced delocalization effect using a 30 kV-STEM

(2011) K. Suenaga et al.   EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS

Probing the Out-of-Plane Distortion of Single Point Defects in Atomically Thin Hexagonal Boron Nitride at the Picometer Scale

(2011) Nasim Alem et al.   PHYSICAL REVIEW LETTERS

Transmission electron microscopy at 20kV for imaging and spectroscopy

(2011) U. Kaiser et al.   ULTRAMICROSCOPY

Information Transfer in a TEM Corrected for Spherical and Chromatic Aberration

(2010) M. Haider et al.   MICROSCOPY AND MICROANALYSIS

Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy

(2010) Ondrej L. Krivanek et al.   NATURE

Atom-by-atom spectroscopy at graphene edge

(2010) Kazu Suenaga et al.   NATURE

Aplanatic imaging systems for the transmission electron microscope

(2010) Heiko Müller et al.   NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT

Structural imaging of β-Si3N4 by spherical aberration-corrected high-resolution transmission electron microscopy

(2009) Zaoli Zhang et al.   ULTRAMICROSCOPY

Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit

(2008) C. Kisielowski et al.   MICROSCOPY AND MICROANALYSIS

Quantification of the Information Limit of Transmission Electron Microscopes

(2008) J. Barthel et al.   PHYSICAL REVIEW LETTERS

Studying Atomic Structures by Aberration-Corrected Transmission Electron Microscopy

(2008) K. W. Urban   SCIENCE

Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM

(2007) M. Haider et al.   ULTRAMICROSCOPY