Structural imaging of β-Si3N4 by spherical aberration-corrected high-resolution transmission electron microscopy

Title
Structural imaging of β-Si3N4 by spherical aberration-corrected high-resolution transmission electron microscopy
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 109, Issue 9, Pages 1114-1120
Publisher
Elsevier BV
Online
2009-05-09
DOI
10.1016/j.ultramic.2009.04.004

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