Temperature-Humidity-Bias Testing and Life Prediction Modeling for Electrochemical Migration in Aerosol-Jet Printed Circuits
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Title
Temperature-Humidity-Bias Testing and Life Prediction Modeling for Electrochemical Migration in Aerosol-Jet Printed Circuits
Authors
Keywords
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Journal
JOURNAL OF ELECTRONIC PACKAGING
Volume 145, Issue 4, Pages -
Publisher
ASME International
Online
2023-09-30
DOI
10.1115/1.4063541
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