Hybrid Organic/Inorganic Materials Depth Profiling Using Low Energy Cesium Ions
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Title
Hybrid Organic/Inorganic Materials Depth Profiling Using Low Energy Cesium Ions
Authors
Keywords
Organic electronics, OLEDs, OPVs, Hybrid materials, SIMS, Cesium, Depth profiling
Journal
JOURNAL OF THE AMERICAN SOCIETY FOR MASS SPECTROMETRY
Volume 27, Issue 5, Pages 908-916
Publisher
Springer Nature
Online
2016-02-16
DOI
10.1007/s13361-016-1353-9
References
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