Depth Profiling of Organic Films with X-ray Photoelectron Spectroscopy Using C60+and Ar+Co-Sputtering

Published 2008 View Full Article

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Title
Depth Profiling of Organic Films with X-ray Photoelectron Spectroscopy Using C60+and Ar+Co-Sputtering
Authors
Keywords
-
Journal
ANALYTICAL CHEMISTRY
Volume 80, Issue 9, Pages 3412-3415
Publisher
American Chemical Society (ACS)
Online
2008-03-21
DOI
10.1021/ac702626n

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