Atomic structures and electronic properties of different interface types at Al/c-SiO2 interfaces

Effects of Transition Element Additions on the Interfacial Interaction and Electronic Structure of Al(111)/6H-SiC(0001) Interface: A First-Principles Study

(2021) Changqing Wang et al.   Materials

Density-functional-theory approach to determine band offsets and dielectric breakdown properties across metal/crystal oxide and metal/amorphous oxide interfaces: A case study of Al/SiO2

(2019) Jianqiu Huang et al.   APPLIED SURFACE SCIENCE

Silicon Oxide (SiO x ): A Promising Material for Resistance Switching?

(2018) Adnan Mehonic et al.   ADVANCED MATERIALS

Electron Transport from Quantum Kinetic Monte Carlo Simulations

(2018) Fei Lin et al.   Journal of Physical Chemistry C

Atomic bonding and electrical potential at metal/oxide interfaces, a first principle study

(2017) Eric Tea et al.   JOURNAL OF CHEMICAL PHYSICS

Germanene on Al(111): Interface Electronic States and Charge Transfer

(2016) R. Stephan et al.   Journal of Physical Chemistry C

First principles study of band line up at defective metal-oxide interface: oxygen point defects at Al/SiO2interface

(2016) Eric Tea et al.   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Failure Analysis in Magnetic Tunnel Junction Nanopillar with Interfacial Perpendicular Magnetic Anisotropy

(2016) Weisheng Zhao et al.   Materials

Ultra-thin dielectric breakdown in devices and circuits: A brief review

(2015) Chih-Hsiang Ho et al.   MICROELECTRONICS RELIABILITY

Time dependent dielectric breakdown physics – Models revisited

(2012) J.W. McPherson   MICROELECTRONICS RELIABILITY

Development of hafnium based high-k materials—A review

(2011) J.H. Choi et al.   MATERIALS SCIENCE & ENGINEERING R-REPORTS

Interfacial interactions between local defects in amorphous SiO2and supported graphene

(2011) A. N. Rudenko et al.   PHYSICAL REVIEW B

Photoconductivity measurements of the electronic structure of organic solar cells

(2011) R. A. Street et al.   PHYSICAL REVIEW B

Distributions of barrier heights, difference of effective contact potential, and local values of flat-band voltage in Al–SiO2–Si and poly–Si–SiO2–Si structures

(2007) H.M. Przewlocki et al.   THIN SOLID FILMS