Atomic structures and electronic properties of different interface types at Al/c-SiO2 interfaces
出版年份 2021 全文链接
标题
Atomic structures and electronic properties of different interface types at Al/c-SiO2 interfaces
作者
关键词
Al/c-SiO, 2, interface, Dielectric breakdown, Virtual oxide thinning, First-principle
出版物
APPLIED SURFACE SCIENCE
Volume 578, Issue -, Pages 151932
出版商
Elsevier BV
发表日期
2021-11-19
DOI
10.1016/j.apsusc.2021.151932
参考文献
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