Ultra-thin dielectric breakdown in devices and circuits: A brief review

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Title
Ultra-thin dielectric breakdown in devices and circuits: A brief review
Authors
Keywords
Breakdown statistics, Circuit lifetime prediction, Compact model, Magnetic tunnel junction (MTJ), Time-dependent dielectric breakdown (TDDB), Ultra-thin dielectric
Journal
MICROELECTRONICS RELIABILITY
Volume 55, Issue 2, Pages 308-317
Publisher
Elsevier BV
Online
2014-11-21
DOI
10.1016/j.microrel.2014.10.019

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