A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations
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Title
A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations
Authors
Keywords
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Journal
COMPUTATIONAL MATERIALS SCIENCE
Volume 197, Issue -, Pages 110560
Publisher
Elsevier BV
Online
2021-05-19
DOI
10.1016/j.commatsci.2021.110560
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