Automated defect analysis in electron microscopic images

Title
Automated defect analysis in electron microscopic images
Authors
Keywords
-
Journal
npj Computational Materials
Volume 4, Issue 1, Pages -
Publisher
Springer Nature
Online
2018-07-12
DOI
10.1038/s41524-018-0093-8

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started