DeepRes: a new deep-learning- and aspect-based local resolution method for electron-microscopy maps

Published 2019 View Full Article

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Title
DeepRes: a new deep-learning- and aspect-based local resolution method for electron-microscopy maps
Authors
Keywords
-
Journal
IUCrJ
Volume 6, Issue 6, Pages -
Publisher
International Union of Crystallography (IUCr)
Online
2019-09-17
DOI
10.1107/s2052252519011692

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