A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations

标题
A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations
作者
关键词
-
出版物
COMPUTATIONAL MATERIALS SCIENCE
Volume 197, Issue -, Pages 110560
出版商
Elsevier BV
发表日期
2021-05-19
DOI
10.1016/j.commatsci.2021.110560

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