Variability and Yield in h‐BN‐Based Memristive Circuits: The Role of Each Type of Defect
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Title
Variability and Yield in h‐BN‐Based Memristive Circuits: The Role of Each Type of Defect
Authors
Keywords
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Journal
ADVANCED MATERIALS
Volume -, Issue -, Pages 2103656
Publisher
Wiley
Online
2021-09-04
DOI
10.1002/adma.202103656
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