Scanning Tunneling Microscopy Characterization of the Electrical Properties of Wrinkles in Exfoliated Graphene Monolayers

Published 2009 View Full Article

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Title
Scanning Tunneling Microscopy Characterization of the Electrical Properties of Wrinkles in Exfoliated Graphene Monolayers
Authors
Keywords
-
Journal
NANO LETTERS
Volume 9, Issue 12, Pages 4446-4451
Publisher
American Chemical Society (ACS)
Online
2009-10-24
DOI
10.1021/nl902729p

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