Variability and Yield in h‐BN‐Based Memristive Circuits: The Role of Each Type of Defect

标题
Variability and Yield in h‐BN‐Based Memristive Circuits: The Role of Each Type of Defect
作者
关键词
-
出版物
ADVANCED MATERIALS
Volume -, Issue -, Pages 2103656
出版商
Wiley
发表日期
2021-09-04
DOI
10.1002/adma.202103656

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