ALD growth of ZnO on p-Si and electrical characterization of ZnO/p-Si heterojunctions

Title
ALD growth of ZnO on p-Si and electrical characterization of ZnO/p-Si heterojunctions
Authors
Keywords
ZnO/p-Si, ZnO surface morphology, Activation energies, Donor-type defects
Journal
Materials Today Communications
Volume 25, Issue -, Pages 101265
Publisher
Elsevier BV
Online
2020-06-01
DOI
10.1016/j.mtcomm.2020.101265

Ask authors/readers for more resources

Reprint

Contact the author

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started