Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition

Three-dimensional maps of geometrically necessary dislocation densities in additively manufactured Ni-based superalloy IN718

(2020) Wyatt A. Witzen et al.   INTERNATIONAL JOURNAL OF PLASTICITY

Serial sectioning in the SEM for three dimensional materials science

(2020) McLean P. Echlin et al.   CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE

Dislocation dynamics in a nickel-based superalloy via in-situ transmission scanning electron microscopy

(2019) J.C. Stinville et al.   ACTA MATERIALIA

Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond

(2019) Colin Ophus   MICROSCOPY AND MICROANALYSIS

NLPAR: Non-local smoothing for enhanced EBSD pattern indexing

(2019) Patrick T. Brewick et al.   ULTRAMICROSCOPY

Subsampled Acquisition to Increase Speed and Reduce Data Size for In Situ TEM

(2019) Benjamin Bammes et al.   MICROSCOPY AND MICROANALYSIS

Prediction of potential pseudo-symmetry issues in the indexing of electron backscatter diffraction patterns

(2019) William Lenthe et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Solidification-driven orientation gradients in additively manufactured stainless steel

(2019) Andrew T. Polonsky et al.   ACTA MATERIALIA

Atomic resolution convergent beam electron diffraction analysis using convolutional neural networks

(2019) Chenyu Zhang et al.   ULTRAMICROSCOPY

A spherical harmonic transform approach to the indexing of electron back-scattered diffraction patterns

(2019) W.C. Lenthe et al.   ULTRAMICROSCOPY

On the resolution of EBSD across atomic density and accelerating voltage with a particular focus on the light metal magnesium

(2019) Abhishek Tripathi et al.   ULTRAMICROSCOPY

Practical application of direct electron detectors to EBSD mapping in 2D and 3D

(2018) K.P. Mingard et al.   ULTRAMICROSCOPY

Transmission scanning electron microscopy: Defect observations and image simulations

(2018) Patrick G. Callahan et al.   ULTRAMICROSCOPY

Electron ptychography of 2D materials to deep sub-ångström resolution

(2018) Yi Jiang et al.   NATURE

High resolution low kV EBSD of heavily deformed and nanocrystalline Aluminium by dictionary-based indexing

(2018) Saransh Singh et al.   Scientific Reports

Demonstrating the potential of accurate absolute cross-grain stress and orientation correlation using electron backscatter diffraction

(2018) Tijmen Vermeij et al.   SCRIPTA MATERIALIA

Influence of Noise-Generating Factors on Cross-Correlation Electron Backscatter Diffraction (EBSD) Measurement of Geometrically Necessary Dislocations (GNDs)

(2017) Landon T. Hansen et al.   MICROSCOPY AND MICROANALYSIS

Diffraction contrast dependence on sample thickness and incident energy in on-axis Transmission Kikuchi Diffraction in SEM

(2017) E. Brodu et al.   ULTRAMICROSCOPY

Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution

(2017) Hao Yang et al.   ULTRAMICROSCOPY

Error analysis of the crystal orientations obtained by the dictionary approach to EBSD indexing

(2017) Farangis Ram et al.   ULTRAMICROSCOPY

High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy

(2016) Mark W. Tate et al.   MICROSCOPY AND MICROANALYSIS

Orientation sampling for dictionary-based diffraction pattern indexing methods

(2016) S Singh et al.   MODELLING AND SIMULATION IN MATERIALS SCIENCE AND ENGINEERING

Orientation mapping by transmission-SEM with an on-axis detector

(2016) J.J. Fundenberger et al.   ULTRAMICROSCOPY

Large volume serial section tomography by Xe Plasma FIB dual beam microscopy

(2016) T.L. Burnett et al.   ULTRAMICROSCOPY

Pixelated detectors and improved efficiency for magnetic imaging in STEM differential phase contrast

(2016) Matus Krajnak et al.   ULTRAMICROSCOPY

Strain mapping at nanometer resolution using advanced nano-beam electron diffraction

(2015) V. B. Ozdol et al.   APPLIED PHYSICS LETTERS

Microstructure effects on the recrystallization of low-symmetry alpha-uranium

(2015) R.J. McCabe et al.   JOURNAL OF NUCLEAR MATERIALS

The TriBeam system: Femtosecond laser ablation in situ SEM

(2015) McLean P. Echlin et al.   MATERIALS CHARACTERIZATION

A Dictionary Approach to Electron Backscatter Diffraction Indexing

(2015) Yu H. Chen et al.   MICROSCOPY AND MICROANALYSIS

Digital direct electron imaging of energy-filtered electron backscatter diffraction patterns

(2015) S. Vespucci et al.   PHYSICAL REVIEW B

Catadioptric aberration correction in cathode lens microscopy

(2015) R.M. Tromp   ULTRAMICROSCOPY

Introduction and comparison of new EBSD post-processing methodologies

(2015) Stuart I. Wright et al.   ULTRAMICROSCOPY

Comparison of optimal performance at 300keV of three direct electron detectors for use in low dose electron microscopy

(2014) G. McMullan et al.   ULTRAMICROSCOPY

Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction

(2014) Knut Müller et al.   Nature Communications

Dynamical Electron Backscatter Diffraction Patterns. Part I: Pattern Simulations

(2013) Patrick G. Callahan et al.   MICROSCOPY AND MICROANALYSIS

Electron counting and beam-induced motion correction enable near-atomic-resolution single-particle cryo-EM

(2013) Xueming Li et al.   NATURE METHODS

Direct Detection of Electron Backscatter Diffraction Patterns

(2013) Angus J. Wilkinson et al.   PHYSICAL REVIEW LETTERS

Direct electron detection yields cryo-EM reconstructions at resolutions beyond 3/4 Nyquist frequency

(2012) Benjamin E. Bammes et al.   JOURNAL OF STRUCTURAL BIOLOGY

Orientation mapping of nanostructured materials using transmission Kikuchi diffraction in the scanning electron microscope

(2012) Patrick W. Trimby   ULTRAMICROSCOPY

MAXIPIX, a fast readout photon-counting X-ray area detector for synchrotron applications

(2011) C Ponchut et al.   Journal of Instrumentation

Transmission EBSD from 10 nm domains in a scanning electron microscope

(2011) R.R. KELLER et al.   JOURNAL OF MICROSCOPY

Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction

(2011) T.B. Britton et al.   ULTRAMICROSCOPY

Towards ultrahigh resolution EBSD by low accelerating voltage

(2010) D. R. Steinmetz et al.   MATERIALS SCIENCE AND TECHNOLOGY

Characterization of order domains in γ-TiAl by orientation microscopy based on electron backscatter diffraction

(2009) Claudio Zambaldi et al.   JOURNAL OF APPLIED CRYSTALLOGRAPHY

Dynamical effects of anisotropic inelastic scattering in electron backscatter diffraction

(2008) Aimo Winkelmann   ULTRAMICROSCOPY