Characterization of order domains in γ-TiAl by orientation microscopy based on electron backscatter diffraction

Published 2009 View Full Article

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Title
Characterization of order domains in γ-TiAl by orientation microscopy based on electron backscatter diffraction
Authors
Keywords
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Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 42, Issue 6, Pages 1092-1101
Publisher
International Union of Crystallography (IUCr)
Online
2009-10-14
DOI
10.1107/s0021889809036498

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