Large volume serial section tomography by Xe Plasma FIB dual beam microscopy

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Title
Large volume serial section tomography by Xe Plasma FIB dual beam microscopy
Authors
Keywords
Xe, Plasma FIB-SEM dual beam microscope, Scanning electron microscopy, 3D imaging, X-ray micro-tomography (micro-CT), A508 grade 3 steel
Journal
ULTRAMICROSCOPY
Volume 161, Issue -, Pages 119-129
Publisher
Elsevier BV
Online
2015-11-11
DOI
10.1016/j.ultramic.2015.11.001

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