Characteristic investigation of highly oriented Hf0.5Zr0.5O2 thin-film resistive memory devices
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Title
Characteristic investigation of highly oriented Hf0.5Zr0.5O2 thin-film resistive memory devices
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 116, Issue 1, Pages 013506
Publisher
AIP Publishing
Online
2020-01-06
DOI
10.1063/1.5141132
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