One-step deposition of nano-to-micron-scalable, high-quality digital image correlation patterns for high-strain in-situ multi-microscopy testing
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Title
One-step deposition of nano-to-micron-scalable, high-quality digital image correlation patterns for high-strain in-situ
multi-microscopy testing
Authors
Keywords
-
Journal
STRAIN
Volume -, Issue -, Pages e12330
Publisher
Wiley
Online
2019-08-30
DOI
10.1111/str.12330
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