Journal
EXPERIMENTAL MECHANICS
Volume 57, Issue 8, Pages 1161-1181Publisher
SPRINGER
DOI: 10.1007/s11340-017-0283-1
Keywords
Digital image correlation; Speckle pattern; Micro/Nano-scale; Deformation measurement
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Funding
- National Natural Science Foundation of China (NSFC) [11272032, 11322220, 11427802, 11602011, 11632010]
- Aeronautical Science Foundation of China [2016ZD51034]
- Beijing Nova Program [xx2014B034]
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As a carrier of deformation information, the speckle pattern, or more exactly the random intensity distributions, which could be naturally occurred or artificially fabricated onto test samples' surface, plays an indispensable role in digital image correlation (DIC). It is now well recognized that the accuracy and precision in DIC measurements not only rely on correlation algorithms, but also depend highly on the quality of the speckle pattern. Considering the huge diversity in test materials, spatial scales and experimental conditions, speckle pattern fabrication could be a challenging issue facing DIC practitioners. To obtain good speckle patterns suitable for DIC measurements, some key issues of fabrication methods and quality assessment of speckle patterns must be well addressed. To this end, this review systematically presents the speckle pattern classification and fabrication techniques for various samples and scales, as well as some typical quality assessment metrics.
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