Direct Probing of Grain Boundary Resistance in Chemical Vapor Deposition‐Grown Monolayer MoS 2 by Conductive Atomic Force Microscopy
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Title
Direct Probing of Grain Boundary Resistance in Chemical Vapor Deposition‐Grown Monolayer MoS
2
by Conductive Atomic Force Microscopy
Authors
Keywords
-
Journal
Physica Status Solidi-Rapid Research Letters
Volume -, Issue -, Pages 1900393
Publisher
Wiley
Online
2019-08-21
DOI
10.1002/pssr.201900393
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