Spin transport, magnetoresistance, and electrically detected magnetic resonance in amorphous hydrogenated silicon nitride

Defect chemistry and electronic transport in low-κ dielectrics studied with electrically detected magnetic resonance

(2016) Michael J. Mutch et al.   JOURNAL OF APPLIED PHYSICS

Band diagram for low-k/Cu interconnects: The starting point for understanding back-end-of-line (BEOL) electrical reliability

(2016) Michael J. Mutch et al.   MICROELECTRONICS RELIABILITY

Spin counting in electrically detected magnetic resonance via low-field defect state mixing

(2014) Corey J. Cochrane et al.   APPLIED PHYSICS LETTERS

Thermal stability of paramagnetic defect centers in amorphous silicon nitride films

(2014) Kiyoteru Kobayashi et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Defect structure and electronic properties of SiOC:H films used for back end of line dielectrics

(2014) T. A. Pomorski et al.   JOURNAL OF APPLIED PHYSICS

Spin relaxation in materials lacking coherent charge transport

(2014) N. J. Harmon et al.   PHYSICAL REVIEW B

Detection of interfacial Pb centers in Si/SiO2 metal-oxide-semiconducting field-effect transistors via zero-field spin dependent recombination with observation of precursor pair spin-spin interactions

(2013) C. J. Cochrane et al.   APPLIED PHYSICS LETTERS

Thermal annealing effect on ultraviolet-light-induced leakage current in low-pressure chemical vapor deposited silicon nitride films

(2013) Kiyoteru Kobayashi et al.   THIN SOLID FILMS

Zero-field detection of spin dependent recombination with direct observation of electron nuclear hyperfine interactions in the absence of an oscillating electromagnetic field

(2012) C. J. Cochrane et al.   JOURNAL OF APPLIED PHYSICS

Semiclassical theory of magnetoresistance in positionally disordered organic semiconductors

(2012) N. J. Harmon et al.   PHYSICAL REVIEW B

Spin-Flip Induced Magnetoresistance in Positionally Disordered Organic Solids

(2012) N. J. Harmon et al.   PHYSICAL REVIEW LETTERS

Film Property Requirements for Hermetic Low-k a-SiOxCyNz:H Dielectric Barriers

(2012) S. W. King et al.   ECS Journal of Solid State Science and Technology

Spin dependent tunneling spectroscopy in 1.2 nm dielectrics

(2010) J. T. Ryan et al.   JOURNAL OF APPLIED PHYSICS