Compressed Sensing of Scanning Transmission Electron Microscopy (STEM) With Nonrectangular Scans

A sub-sampled approach to extremely low-dose STEM

(2018) A. Stevens et al.   APPLIED PHYSICS LETTERS

Direct atomic fabrication and dopant positioning in Si using electron beams with active real-time image-based feedback

(2018) Stephen Jesse et al.   NANOTECHNOLOGY

Engineering and modifying two-dimensional materials by electron beams

(2017) Xiaoxu Zhao et al.   MRS BULLETIN

Single-atom fabrication with electron and ion beams: From surfaces and two-dimensional materials toward three-dimensional atom-by-atom assembly

(2017) Sergei V. Kalinin et al.   MRS BULLETIN

Atom-by-atom fabrication by electron beam via induced phase transformations

(2017) Nan Jiang et al.   MRS BULLETIN

The impact of STEM aberration correction on materials science

(2017) Stephen J. Pennycook   ULTRAMICROSCOPY

Manipulating low-dimensional materials down to the level of single atoms with electron irradiation

(2017) Toma Susi et al.   ULTRAMICROSCOPY

Implementing an accurate and rapid sparse sampling approach for low-dose atomic resolution STEM imaging

(2016) L. Kovarik et al.   APPLIED PHYSICS LETTERS

Quantifying the Advantages of Compressive Sensing and Sparse Reconstruction for Scanning Transmission Electron Microscopy

(2016) Bryan W. Reed et al.   MICROSCOPY AND MICROANALYSIS

Fire up the atom forge

(2016) Sergei V. Kalinin et al.   NATURE

Electron beam damage in oxides: a review

(2015) Nan Jiang   REPORTS ON PROGRESS IN PHYSICS

Atomic-Level Sculpting of Crystalline Oxides: Toward Bulk Nanofabrication with Single Atomic Plane Precision

(2015) Stephen Jesse et al.   Small

Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution

(2015) Timothy J. Pennycook et al.   ULTRAMICROSCOPY

Vibrational spectroscopy in the electron microscope

(2014) Ondrej L. Krivanek et al.   NATURE

Silicon–Carbon Bond Inversions Driven by 60-keV Electrons in Graphene

(2014) Toma Susi et al.   PHYSICAL REVIEW LETTERS

Comparison of optimal performance at 300keV of three direct electron detectors for use in low dose electron microscopy

(2014) G. McMullan et al.   ULTRAMICROSCOPY

Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope

(2013) Lewys Jones et al.   MICROSCOPY AND MICROANALYSIS

The potential for Bayesian compressive sensing to significantly reduce electron dose in high-resolution STEM images

(2013) Andrew Stevens et al.   Microscopy

Single Atom Microscopy

(2012) Wu Zhou et al.   MICROSCOPY AND MICROANALYSIS

High-speed multiresolution scanning probe microscopy based on Lissajous scan trajectories

(2012) Tomas Tuma et al.   NANOTECHNOLOGY

High-speed Lissajous-scan atomic force microscopy: Scan pattern planning and control design issues

(2012) A. Bazaei et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

The Numerical Tours of Signal Processing

(2011) Gabriel Peyré   COMPUTING IN SCIENCE & ENGINEERING

Atom-by-atom structural and chemical analysis by annular dark-field electron microscopy

(2010) Ondrej L. Krivanek et al.   NATURE

Dynamics of annular bright field imaging in scanning transmission electron microscopy

(2010) S.D. Findlay et al.   ULTRAMICROSCOPY

Robust atomic resolution imaging of light elements using scanning transmission electron microscopy

(2009) S. D. Findlay et al.   APPLIED PHYSICS LETTERS

Visualization of Light Elements at Ultrahigh Resolution by STEM Annular Bright Field Microscopy

(2009) E Okunishi et al.   MICROSCOPY AND MICROANALYSIS

Enhanced imaging in low dose electron microscopy using electron counting

(2009) G. McMullan et al.   ULTRAMICROSCOPY