High-resolution imaging with SEM/T-SEM, EDX and SAM as a combined methodical approach for morphological and elemental analyses of single engineered nanoparticles

Title
High-resolution imaging with SEM/T-SEM, EDX and SAM as a combined methodical approach for morphological and elemental analyses of single engineered nanoparticles
Authors
Keywords
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Journal
RSC Advances
Volume 4, Issue 91, Pages 49577-49587
Publisher
Royal Society of Chemistry (RSC)
Online
2014-10-07
DOI
10.1039/c4ra05092d

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