High-resolution imaging with SEM/T-SEM, EDX and SAM as a combined methodical approach for morphological and elemental analyses of single engineered nanoparticles

标题
High-resolution imaging with SEM/T-SEM, EDX and SAM as a combined methodical approach for morphological and elemental analyses of single engineered nanoparticles
作者
关键词
-
出版物
RSC Advances
Volume 4, Issue 91, Pages 49577-49587
出版商
Royal Society of Chemistry (RSC)
发表日期
2014-10-07
DOI
10.1039/c4ra05092d

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