Removing Material Using Atomic Force Microscopy with Single- and Multiple-Tip Sources

Mechanical Characteristics of Nanoscratched Gallium Arsenide Using Molecular Dynamics Simulation

(2011) Te-Hua Fang et al.   Nanoscience and Nanotechnology Letters

Probe-Based 3-D Nanolithography Using Self-Amplified Depolymerization Polymers

(2010) Armin W. Knoll et al.   ADVANCED MATERIALS

A comparison study of scratch and wear properties using atomic force microscopy

(2010) Ampere A. Tseng   APPLIED SURFACE SCIENCE

A study of AFM-based scratch process on polycarbonate surface and grating application

(2010) Chul Hyun Choi et al.   APPLIED SURFACE SCIENCE

Study of AFM-based nanometric cutting process using molecular dynamics

(2010) Peng-zhe Zhu et al.   APPLIED SURFACE SCIENCE

Probe-Tip Induced Damage in Compliant Substrates

(2010) Michael Chandross et al.   JOURNAL OF MANUFACTURING SCIENCE AND ENGINEERING-TRANSACTIONS OF THE ASME

Development of a Novel Process Chain Based on Atomic Force Microscopy Scratching for Small and Medium Series Production of Polymer Nanostructured Components

(2010) E. B. Brousseau et al.   JOURNAL OF MANUFACTURING SCIENCE AND ENGINEERING-TRANSACTIONS OF THE ASME

Study of a High Performance AFM Probe-Based Microscribing Process

(2010) Keith Bourne et al.   JOURNAL OF MANUFACTURING SCIENCE AND ENGINEERING-TRANSACTIONS OF THE ASME

Nanolithography of Single-Layer Graphene Oxide Films by Atomic Force Microscopy

(2010) Gang Lu et al.   LANGMUIR

Experimental and numerical study of electrochemical nanomachining using an AFM cantilever tip

(2010) Gyudo Lee et al.   NANOTECHNOLOGY

Nanoscale Three-Dimensional Patterning of Molecular Resists by Scanning Probes

(2010) D. Pires et al.   SCIENCE

Top-Down Nanomechanical Machining of Three-Dimensional Nanostructures by Atomic Force Microscopy

(2010) Yongda Yan et al.   Small

Direct writing and characterization of poly(p-phenylene vinylene) nanostructures

(2009) Debin Wang et al.   APPLIED PHYSICS LETTERS

Scratching properties of nickel-iron thin film and silicon using atomic force microscopy

(2009) Ampere A. Tseng et al.   JOURNAL OF APPLIED PHYSICS

Characterization and acoustic emission monitoring of AFM nanomachining

(2009) B W Ahn et al.   JOURNAL OF MICROMECHANICS AND MICROENGINEERING

Probe-Based Nanolithography: Self-Amplified Depolymerization Media for Dry Lithography

(2009) Olivier Coulembier et al.   MACROMOLECULES

Atomic force microscopy as a tool for atom manipulation

(2009) Oscar Custance et al.   Nature Nanotechnology

Dynamic superlubricity and the elimination of wear on the nanoscale

(2009) Mark A. Lantz et al.   Nature Nanotechnology

Molecular dynamics study of groove fabrication process using AFM-based nanometric cutting technique

(2008) Junjie Zhang et al.   APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING

Molecular dynamics simulation of subsurface deformed layers in AFM-based nanometric cutting process

(2008) J.J. Zhang et al.   APPLIED SURFACE SCIENCE

Scratch Nanolithography on Si Surface Using Scanning Probe Microscopy: Influence of Scanning Parameters on Groove Size

(2008) Takumi Ogino et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Fabrication of microstructures on the surface of a micro/hollow target ball by AFM

(2008) Y D Yan et al.   JOURNAL OF MICROMECHANICS AND MICROENGINEERING

Recent Developments in Tip-Based Nanofabrication and Its Roadmap

(2008) Ampere A. Tseng et al.   JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY

Controllable Formation of Nanoscale Patterns on TiO2by Conductive-AFM Nanolithography

(2008) B. Garipcan et al.   LANGMUIR

Nanopatterning materials using area selective atomic layer deposition in conjunction with thermochemical surface modification via heated AFM cantilever probe lithography

(2008) Yueming Hua et al.   MICROELECTRONIC ENGINEERING

Single-step electrochemical nanolithography of metal thin films by localized etching with an AFM tip

(2008) O de Abril et al.   NANOTECHNOLOGY

Surface patterning for brittle amorphous material using nanoindenter-based mechanochemical nanofabrication

(2008) Jeong Woo Park et al.   NANOTECHNOLOGY

Invited Review Article: Accurate and fast nanopositioning with piezoelectric tube scanners: Emerging trends and future challenges

(2008) S. O. Reza Moheimani   REVIEW OF SCIENTIFIC INSTRUMENTS

The Force Needed to Move an Atom on a Surface

(2008) M. Ternes et al.   SCIENCE