In situ nanomechanical testing in focused ion beam and scanning electron microscopes
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Title
In situ nanomechanical testing in focused ion beam and scanning electron microscopes
Authors
Keywords
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Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 82, Issue 6, Pages 063901
Publisher
AIP Publishing
Online
2011-06-05
DOI
10.1063/1.3595423
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