In situ compression tests on micron-sized silicon pillars by Raman microscopy—Stress measurements and deformation analysis

Published 2008 View Full Article

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Title
In situ compression tests on micron-sized silicon pillars by Raman microscopy—Stress measurements and deformation analysis
Authors
Keywords
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Journal
JOURNAL OF MATERIALS RESEARCH
Volume 23, Issue 11, Pages 3040-3047
Publisher
Cambridge University Press (CUP)
Online
2008-11-01
DOI
10.1557/jmr.2008.0363

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