Dynamic time warping assessment of high-resolution melt curves provides a robust metric for fungal identification
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Title
Dynamic time warping assessment of high-resolution melt curves provides a robust metric for fungal identification
Authors
Keywords
Candida albicans, Sequence databases, DNA sequence analysis, Distance measurement, Yeast, Nucleotide sequencing, Fungal classification, Polymerase chain reaction
Journal
PLoS One
Volume 12, Issue 3, Pages e0173320
Publisher
Public Library of Science (PLoS)
Online
2017-03-07
DOI
10.1371/journal.pone.0173320
References
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